Application：
CP and FT testing of MCU, Flash, LDO, ADC, DAC, Logic and other chip parameters.
Main Features：
● Digital channel built PPMU/ frequency measurement unit
● Source/Capture vector
● Up to 2GB storage depth SCAN vector
● ALPG vector generation test memory chip
RF isolation performance:
| Max data rate | 200Mbps |
| Max digital channel | 512（64*8） |
| Device power supply quantity | 32（16*2） |
| Device power parameters | -10V~+10V/Max. 8A |
| Measurement voltage range | -1.5V~+6.5V/ accuracy 10mV |
| Measurement current range | ±2uA/±20uA/±200uA±2mA/±50mA |
Application：
| Mechanical Specification | |
External dimension (testing machine) | 520(W)*490 (L)*650(H)mm |
Net Weight (testing machine) | approx.70kg |
Gross Weight (testing machine） | approx.100kg |
Electrical specification | |
Power Consumption | 3000W |
Input Voltage | 200~240VAC 50/60Hz |
